DocumentCode
1309692
Title
Proton upset rate simulation by a Monte Carlo method: importance of the elastic scattering mechanism
Author
Inguimbert, C. ; Duzellier, S. ; Ecoffet, R. ; Bourrieau, J.
Author_Institution
ONERA-CERT, Toulouse, France
Volume
44
Issue
6
fYear
1997
fDate
12/1/1997 12:00:00 AM
Firstpage
2243
Lastpage
2249
Abstract
This paper describes the calculation of the proton upset cross section by a Monte Carlo method (SEUSIM code). The computation combines heavy ion experimental data and the results of modelling of the inelastic nuclear reaction (NUREAC code). We improved the SEUSIM code by introducing P+Si elastic scattering (ELASTIC code). The importance of the contribution of elastic scattering in SEU rate prediction is discussed
Keywords
Monte Carlo methods; circuit analysis computing; elemental semiconductors; integrated circuit modelling; integrated circuit reliability; proton effects; proton-nucleus scattering; silicon; ELASTIC code; Monte Carlo method; SEU rate prediction; SEUSIM code; elastic scattering mechanism; heavy ion experimental data; inelastic nuclear reaction; proton upset rate simulation; Computational modeling; Excitons; Mathematical model; Microelectronics; Particle scattering; Protons; Silicon; Single event upset; Testing;
fLanguage
English
Journal_Title
Nuclear Science, IEEE Transactions on
Publisher
ieee
ISSN
0018-9499
Type
jour
DOI
10.1109/23.659042
Filename
659042
Link To Document