DocumentCode

1315282

Title

Comment on Editorial "Genuine Imitation Bayesians

Author

Bonis, Austin J.

Author_Institution

Rochester Institute of Technology//One Lomb Memorial Drive//Rochester, NY 14623 USA.

Issue

5

fYear

1975

Firstpage

342

Lastpage

342

Keywords

Bayesian methods; Delay; Measurement uncertainty; Robustness; Statistical distributions;

fLanguage

English

Journal_Title

Reliability, IEEE Transactions on

Publisher

ieee

ISSN

0018-9529

Type

jour

DOI

10.1109/TR.1975.5214927

Filename

5214927