DocumentCode
1316086
Title
Cellular automata-based built-in self-test structures for VLSI systems
Author
Tsalides, Ph
Author_Institution
Dept. of Electr. Eng., Democritus Univ. of Thrace, Xanthi, Greece
Volume
26
Issue
17
fYear
1990
Firstpage
1350
Lastpage
1352
Abstract
Some of the fundamental algebraic properties of hybrid additive, null-bounded, cellular automata (HACA) are presented. Simple HACA have been obtained by spatially alternating additive rules 90 and 150 (in Wolfram´s notation). The use of such HACA for on-chip pseudorandom test pattern generation is also described. The great advantage of HACA over linear feedback shift registers (LFSR), as their size increases, is the fact that HACA display locality and topological regularity, important attributes for VLSI implementation.
Keywords
VLSI; automatic testing; finite automata; integrated circuit testing; HACA; VLSI systems; Wolfram´s notation; algebraic properties; built-in self-test structures; cellular automata; hybrid additive; linear feedback shift registers; locality; null-bounded; on-chip pseudorandom test pattern generation; topological regularity;
fLanguage
English
Journal_Title
Electronics Letters
Publisher
iet
ISSN
0013-5194
Type
jour
DOI
10.1049/el:19900869
Filename
82978
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