• DocumentCode
    1316086
  • Title

    Cellular automata-based built-in self-test structures for VLSI systems

  • Author

    Tsalides, Ph

  • Author_Institution
    Dept. of Electr. Eng., Democritus Univ. of Thrace, Xanthi, Greece
  • Volume
    26
  • Issue
    17
  • fYear
    1990
  • Firstpage
    1350
  • Lastpage
    1352
  • Abstract
    Some of the fundamental algebraic properties of hybrid additive, null-bounded, cellular automata (HACA) are presented. Simple HACA have been obtained by spatially alternating additive rules 90 and 150 (in Wolfram´s notation). The use of such HACA for on-chip pseudorandom test pattern generation is also described. The great advantage of HACA over linear feedback shift registers (LFSR), as their size increases, is the fact that HACA display locality and topological regularity, important attributes for VLSI implementation.
  • Keywords
    VLSI; automatic testing; finite automata; integrated circuit testing; HACA; VLSI systems; Wolfram´s notation; algebraic properties; built-in self-test structures; cellular automata; hybrid additive; linear feedback shift registers; locality; null-bounded; on-chip pseudorandom test pattern generation; topological regularity;
  • fLanguage
    English
  • Journal_Title
    Electronics Letters
  • Publisher
    iet
  • ISSN
    0013-5194
  • Type

    jour

  • DOI
    10.1049/el:19900869
  • Filename
    82978