• DocumentCode
    1316765
  • Title

    Concurrent error detection in semi-systolic dual basis multiplier over GF(2m) using self-checking alternating logic

  • Author

    Chiou, Che Wun ; Liang, W.-Y. ; Chang, H.W. ; Lin, Jim-Min ; Lee, Chen-Yi

  • Author_Institution
    Dept. of Comput. Sci. & Inf. Eng., Ching Yun Univ., Chungli, Taiwan
  • Volume
    4
  • Issue
    5
  • fYear
    2010
  • fDate
    9/1/2010 12:00:00 AM
  • Firstpage
    382
  • Lastpage
    391
  • Abstract
    Multiplication is one of the most important finite field arithmetic operations in cryptographic computations. Recently, the attacks of fault-based cryptanalysis have been a critical threat to both symmetrical and asymmetrical cryptosystems. To prevent such kind of attacks, masking faulty signals and outputting only correct ciphers would be a feasible solution, especially suitable for finite field multiplication. Therefore a novel dual basis multiplier in GF(2m) with concurrent error detection capability using self-checking alternating logic is presented. The new self-checking alternating logic dual basis multiplier saves about 67% space complexity as compared with other existing dual basis multiplier with concurrent error detection capability that uses the parity checking method. The proposed dual basis multiplier takes almost as low as one extra clock cycle to achieve concurrent error detection capability. Furthermore, any existing faults in fault model are ensured to be detectable through at least one input in the authors% proposed scheme.
  • Keywords
    Galois fields; circuit complexity; clocks; cryptography; digital arithmetic; fault diagnosis; multiplying circuits; systolic arrays; Galois fields; asymmetrical cryptosystem; clock cycle; concurrent error detection; cryptographic computation; fault model; fault-based cryptanalysis; faulty signal masking; finite field arithmetic operation; finite field multiplication; parity checking; self-checking alternating logic; semisystolic dual basis multiplier; space complexity;
  • fLanguage
    English
  • Journal_Title
    Circuits, Devices & Systems, IET
  • Publisher
    iet
  • ISSN
    1751-858X
  • Type

    jour

  • DOI
    10.1049/iet-cds.2009.0243
  • Filename
    5567022