• DocumentCode
    1316805
  • Title

    Impact of energy quantisation in single electron transistor island on hybrid complementary metal oxide semiconductor– single electron transistor integrated circuits

  • Author

    Dan, S.S. ; Mahapatra, Santanu

  • Author_Institution
    Nanoscale Device Res. Lab., Indian Inst. of Sci., Bangalore, India
  • Volume
    4
  • Issue
    5
  • fYear
    2010
  • fDate
    9/1/2010 12:00:00 AM
  • Firstpage
    449
  • Lastpage
    457
  • Abstract
    For the first time, the impact of energy quantisation in single electron transistor (SET) island on the performance of hybrid complementary metal oxide semiconductor (CMOS)-SET transistor circuits has been studied. It has been shown through simple analytical models that energy quantisation primarily increases the Coulomb Blockade area and Coulomb Blockade oscillation periodicity of the SET device and thus influences the performance of hybrid CMOS-SET circuits. A novel computer aided design (CAD) framework has been developed for hybrid CMOS-SET co-simulation, which uses Monte Carlo (MC) simulator for SET devices along with conventional SPICE for metal oxide semiconductor devices. Using this co-simulation framework, the effects of energy quantisation have been studied for some hybrid circuits, namely, SETMOS, multiband voltage filter and multiple valued logic circuits. Although energy quantisation immensely deteriorates the performance of the hybrid circuits, it has been shown that the performance degradation because of energy quantisation can be compensated by properly tuning the bias current of the current-biased SET devices within the hybrid CMOS-SET circuits. Although this study is primarily done by exhaustive MC simulation, effort has also been put to develop first-order compact model for SET that includes energy quantisation effects. Finally, it has been demonstrated that one can predict the SET behaviour under energy quantisation with reasonable accuracy by slightly modifying the existing SET compact models that are valid for metallic devices having continuous energy states.
  • Keywords
    CMOS integrated circuits; Coulomb blockade; MOSFET; Monte Carlo methods; SPICE; circuit CAD; circuit simulation; circuit tuning; single electron transistors; transistor circuits; CAD framework; Coulomb blockade area; Coulomb blockade oscillation periodicity; MC simulation; Monte Carlo simulator; SET behaviour; SET compact model; SET device; SETMOS circuit; SPICE; bias current tuning; energy quantisation; hybrid CMOS-SET cosimulation; hybrid CMOS-SET transistor circuit; hybrid complementary metal oxide semiconductor-single electron transistor integrated circuits; multiband voltage filter; multiple valued logic circuit; single electron transistor island;
  • fLanguage
    English
  • Journal_Title
    Circuits, Devices & Systems, IET
  • Publisher
    iet
  • ISSN
    1751-858X
  • Type

    jour

  • DOI
    10.1049/iet-cds.2009.0341
  • Filename
    5567029