DocumentCode
131683
Title
Stereo Vision Reconstruction of Infrared Temperature in Microwave Reaction Chamber
Author
Yinhui Zhang ; Jinhui Peng ; Zifen He
Author_Institution
Fac. of Mech. & Electr. Eng., Kunming Univ. of Sci. & Technol., Kunming, China
fYear
2014
fDate
10-11 Jan. 2014
Firstpage
603
Lastpage
606
Abstract
Conventional uncooled infrared temperature detectors can only detect targets in two-dimensional temperature field. We propose to achieve three-dimensional temperature field in microwave reaction chamber through binocular visual reconstruction. The infrared and visible multispectral images at two-views are acquisitioned via an infrared detector. To improve consistency of feature point detection results, we perform stereo matching at visible band with high spatial resolution. Disparity mapping with epipolar geometry constraints between two multiscale images are estimated, with which three-dimensional temperature field of depth information is reconstructed by triangulation back projection. This method does not require calibration of infrared detectors and possess certain research and application significance for carrying out the full range observation of heated objects as well as timely regulation of microwave intensity.
Keywords
image reconstruction; image resolution; infrared detectors; stereo image processing; binocular visual reconstruction; depth information; disparity mapping; epipolar geometry constraints; feature point detection; infrared detector; infrared multispectral images; infrared temperature; microwave intensity; microwave reaction chamber; spatial resolution; stereo matching; stereo vision reconstruction; three-dimensional temperature field; triangulation back projection; two-dimensional temperature field; uncooled infrared temperature detectors; visible multispectral images; Electromagnetic heating; Image reconstruction; Matrix decomposition; Microwave imaging; Microwave theory and techniques; Temperature measurement; Infrared; Microwave temperature; Stereo vision;
fLanguage
English
Publisher
ieee
Conference_Titel
Measuring Technology and Mechatronics Automation (ICMTMA), 2014 Sixth International Conference on
Conference_Location
Zhangjiajie
Print_ISBN
978-1-4799-3434-8
Type
conf
DOI
10.1109/ICMTMA.2014.147
Filename
6802764
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