DocumentCode
1320127
Title
Toward optimizing enhanced surfaces for passive immersion cooled heat sinks
Author
Baldwin, Chris S. ; Bhavnani, Sushil H. ; Jaeger, Richard C.
Author_Institution
Intel Corp., Chandler, AZ, USA
Volume
23
Issue
1
fYear
2000
fDate
3/1/2000 12:00:00 AM
Firstpage
70
Lastpage
79
Abstract
Reduction in die feature-size due to improvements in microelectronics fabrication technology have increased the demands on effective thermal management. As a consequence, innovative heat removal schemes need to be explored. Immersion cooling in a dielectric fluid, despite the increased complications, continues to be studied as a possible solution. The characteristics of a surface used as a pool boiling heat sink depend on its microscopic features. This paper reports results from an investigation in which the shape and spacing of these microscopic features were studied in order to achieve improved thermal performance. The heat sources were thin-film heaters deposited in an array on a silicon wafer which was immersed in PC-72
Keywords
boiling; cooling; heat sinks; thermal management (packaging); PC-72; dielectric fluid; heat sink; heat transfer; liquid immersion cooling; microelectronics technology; passive thermal enhancement; pool boiling; silicon wafer; surface optimization; thermal management; thin film heater array; Dielectrics; Fabrication; Heat sinks; Immersion cooling; Microelectronics; Microscopy; Semiconductor thin films; Shape; Technology management; Thermal management;
fLanguage
English
Journal_Title
Components and Packaging Technologies, IEEE Transactions on
Publisher
ieee
ISSN
1521-3331
Type
jour
DOI
10.1109/6144.833044
Filename
833044
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