• DocumentCode
    1320127
  • Title

    Toward optimizing enhanced surfaces for passive immersion cooled heat sinks

  • Author

    Baldwin, Chris S. ; Bhavnani, Sushil H. ; Jaeger, Richard C.

  • Author_Institution
    Intel Corp., Chandler, AZ, USA
  • Volume
    23
  • Issue
    1
  • fYear
    2000
  • fDate
    3/1/2000 12:00:00 AM
  • Firstpage
    70
  • Lastpage
    79
  • Abstract
    Reduction in die feature-size due to improvements in microelectronics fabrication technology have increased the demands on effective thermal management. As a consequence, innovative heat removal schemes need to be explored. Immersion cooling in a dielectric fluid, despite the increased complications, continues to be studied as a possible solution. The characteristics of a surface used as a pool boiling heat sink depend on its microscopic features. This paper reports results from an investigation in which the shape and spacing of these microscopic features were studied in order to achieve improved thermal performance. The heat sources were thin-film heaters deposited in an array on a silicon wafer which was immersed in PC-72
  • Keywords
    boiling; cooling; heat sinks; thermal management (packaging); PC-72; dielectric fluid; heat sink; heat transfer; liquid immersion cooling; microelectronics technology; passive thermal enhancement; pool boiling; silicon wafer; surface optimization; thermal management; thin film heater array; Dielectrics; Fabrication; Heat sinks; Immersion cooling; Microelectronics; Microscopy; Semiconductor thin films; Shape; Technology management; Thermal management;
  • fLanguage
    English
  • Journal_Title
    Components and Packaging Technologies, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1521-3331
  • Type

    jour

  • DOI
    10.1109/6144.833044
  • Filename
    833044