• DocumentCode
    1320316
  • Title

    Exact surface impedance/admittance boundary conditions for complex geometries: theory and applications

  • Author

    Cicchetti, Renato ; Faraone, Antonio

  • Author_Institution
    Dipt. di Ingegneria Elettronica, Rome Univ., Italy
  • Volume
    48
  • Issue
    2
  • fYear
    2000
  • fDate
    2/1/2000 12:00:00 AM
  • Firstpage
    223
  • Lastpage
    230
  • Abstract
    A methodology useful to derive exact and higher order surface impedance/admittance boundary conditions (HOI/ABC´s) for complex geometries is presented. It is shown that exact surface boundary conditions are always expressed through dyadic integral operators involving the tangential magnetic and electric fields all over the surface of the body. Quasi-local surface boundary conditions that include curvature effects are shown to be computable through an asymptotic approximation of the integral operators. Finally, an example of a surface admittance boundary condition useful to analyze a structure exhibiting discontinuities along its surface boundary is presented. Practical examples to demonstrate the feasibility of the proposed methodology, as well as the accuracy of the resulting surface boundary conditions are also presented
  • Keywords
    coaxial cables; electric admittance; electric impedance; electromagnetic wave absorption; electromagnetic wave propagation; surface electromagnetic waves; asymptotic approximation; complex geometries; curvature effects; dielectric rod; discontinuities; dyadic integral operators; electric fields; integral operators; lossy coaxial cable; quasi-local surface boundary conditions; radiation admittance; surface admittance; surface boundary conditions; surface impedance; surface waves; tangential magnetic fields; Admittance; Boundary conditions; Conductors; Dielectric losses; Electromagnetics; Geometry; Integral equations; Polynomials; Surface acoustic waves; Surface impedance;
  • fLanguage
    English
  • Journal_Title
    Antennas and Propagation, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-926X
  • Type

    jour

  • DOI
    10.1109/8.833071
  • Filename
    833071