DocumentCode
1320709
Title
Determining Optimum Burn-In and Replacement Times Using Bayesian Decision Theory
Author
Stewart, Leland T. ; Johnson, J.D.
Author_Institution
Lockheed Palo Alto Research Laboratory, Palo Alto, Calif. 94304.
Issue
3
fYear
1972
Firstpage
170
Lastpage
175
Abstract
An important problem facing a manufacturer is the determination of the amount of time to burn-in items (in order to eliminate early failures) and the age at which to replace items (to avoid failures due to wearout). This problem becomes difficult to solve if the time-to-failure distribution of an item is unknown and must be estimated from test and operational data. This paper describes a method of statistical data analysis which is readily applied to the solution of this decision problem under a realistic but general loss (or gain) function. The method is a multiparameter Bayesian analysis which requires multiple integration of the (multivariate) posterior of the parameters of the time-to-failure distribution to obtain the expected loss (or gain) resulting from a particular choice of burn-in time and item replacement age. This integration is performed by a Monte Carlo Procedure using importance sampling. An example demonstrates the flexibility of this method of analysis. The data are a mixture of ``point´´ and truncated data, which often create difficulties when using conventional methods of decision analysis. In addition, since the method permits up to ten parameters for the family of time-to-failure distributions, a ``bathtub´´ hazard rate function is used to generate the data for the example. The results are presented in the form of Bayesian confidence intervals for the true hazard rate function and a presentation of the expected loss as a function of burn-in time and age at replacement.
Keywords
Bayesian methods; Cost function; Data analysis; Decision theory; Hazards; Job shop scheduling; Manufacturing; Monte Carlo methods; Probability density function; Testing;
fLanguage
English
Journal_Title
Reliability, IEEE Transactions on
Publisher
ieee
ISSN
0018-9529
Type
jour
DOI
10.1109/TR.1972.5215980
Filename
5215980
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