DocumentCode
1321666
Title
Electrode protrusions and particle chaining as factors affecting the dielectric strength of air
Author
Dascalescu, Lucian ; Tobazéon, Robert
Author_Institution
Lab. Univ. de Technol. Electr. et Electroniques Avancees, Inst. Univ. de Technol., Angouleme, France
Volume
36
Issue
2
fYear
2000
Firstpage
526
Lastpage
530
Abstract
Electrode protrusions and free particles have been demonstrated to reduce dramatically the breakdown voltage of insulating fluids. This paper examines two factors which affect the dielectric strength of gaseous insulators: (1) shape and size of electrode protrusions, and (2) particle chain formation. A computer program, based on the boundary element method, was employed for the computation of the electric field modified by an electrode protrusion and/or a particle chain. The results regarding field enhancement were used as input data of another program that evaluated the dielectric strength of the air-gap. Two types of protrusions were studied: hemispheres and hemispherically ended rods. One to ten conductive spheres were considered to be attracted to such protrusions and chain at the top of them. The computations showed that the large protrusions are more harmful than the small ones and that the dielectric strength of the air-gap decreases with the number of particles in a chain
Keywords
air insulation; boundary-elements methods; electric breakdown; electric fields; electric strength; electrical engineering computing; electrodes; air; boundary element method; breakdown voltage reduction; computer program; conductive spheres; dielectric strength; electric field; electrode protrusions; electrostatics; field enhancement; gaseous insulators; hemispheres; hemispherically ended rods; input data; particle chain formation; particle chaining; Air gaps; Boundary element methods; Contamination; Dielectric breakdown; Dielectrics and electrical insulation; Electrodes; Electrostatics; Gas insulation; Industry Applications Society; Shape;
fLanguage
English
Journal_Title
Industry Applications, IEEE Transactions on
Publisher
ieee
ISSN
0093-9994
Type
jour
DOI
10.1109/28.833770
Filename
833770
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