• DocumentCode
    1323200
  • Title

    Diagnostics for logic networks

  • Author

    Susskind, A.K.

  • Author_Institution
    Lehigh University
  • Volume
    10
  • Issue
    10
  • fYear
    1973
  • Firstpage
    40
  • Lastpage
    47
  • Keywords
    Circuit faults; Circuit testing; Combinational circuits; Electrical fault detection; Fault detection; Large scale integration; Logic testing; Sequential analysis; Sequential circuits; System testing;
  • fLanguage
    English
  • Journal_Title
    Spectrum, IEEE
  • Publisher
    ieee
  • ISSN
    0018-9235
  • Type

    jour

  • DOI
    10.1109/MSPEC.1973.5216474
  • Filename
    5216474
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1323200