• DocumentCode
    1324616
  • Title

    Capacitances in double-barrier tunneling structures

  • Author

    Genoe, Jan ; Van Hoof, Chris ; Van Roy, Willem ; Smet, Jurgen H. ; Fobelets, Kristel ; Mertens, Robert P. ; Borghs, Gustaaf

  • Author_Institution
    Interuniv. Micro-Electron. Center, Leuven, Belgium
  • Volume
    38
  • Issue
    9
  • fYear
    1991
  • fDate
    9/1/1991 12:00:00 AM
  • Firstpage
    2006
  • Lastpage
    2012
  • Abstract
    Capacitances in a double-barrier tunneling structure are calculated for the specific sequential electron tunneling regime. Starting from Luryi´s (1988) definition of quantum capacitance, the authors model the charge accumulation in the well during the tunneling process using the Fermi-Dirac distribution. Analytical formulas for the total capacitance and conductance are derived. A complete small-signal model is proposed that demonstrates the external capacitance and conductance of the structure and its frequency behavior. The authors show both theoretically and experimentally that the capacitance in a tunneling structure is both bias- and frequency-dependent
  • Keywords
    capacitance; resonant tunnelling devices; semiconductor device models; tunnel diodes; Fermi-Dirac distribution; bias dependence; charge accumulation; conductance; double-barrier tunneling structures; frequency behavior; quantum capacitance; resonant tunnelling diode; small-signal model; specific sequential electron tunneling regime; total capacitance; Detectors; Electron emission; Energy states; Frequency; Magnetic fields; Potential well; Quantum capacitance; Reservoirs; Tunneling; Voltage;
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/16.83722
  • Filename
    83722