DocumentCode
1325748
Title
Plasma opening switch research for DECADE
Author
Goyer, John R. ; Kortbawi, David ; Childers, F.K. ; Sincerny, Peter S. ; Weber, Bruce V. ; Ottinger, P.F. ; Commisso, Robert J. ; Thompson, John R. ; Babineau, M.A.
Author_Institution
Phys. Int. Co., San Leandro, CA, USA
Volume
25
Issue
2
fYear
1997
fDate
4/1/1997 12:00:00 AM
Firstpage
176
Lastpage
188
Abstract
Plasma opening switch (POS) research for the DECADE radiation effects test facility is reviewed. This research was first performed on a half-scale generator, DECADE Prototype Module 1, and indicated the importance of the POS electrode geometry to obtain the required impedance at appropriate conduction times. It also was demonstrated that the conduction time jitter was suitable for a multimodule system. Preliminary experiments at full energy were then conducted on DECADE Module 1 that indicated significant current loss when using a bremsstrahlung load, limiting the output radiation to about half of the DECADE requirement. These results initiated an effort to thoroughly diagnose the power-flow region downstream of the switch, an effort that ultimately provided improved understanding of POS operation and improved coupling to bremsstrahlung loads. At the conclusion of this effort, it had been demonstrated that it is possible for the POS-driven system to meet the DECADE requirements
Keywords
bremsstrahlung; jitter; plasma devices; plasma switches; radiation effects; DECADE Prototype Module 1; DECADE radiation effects test facility; POS electrode geometry; POS-to-load power flow; anode currents; bremsstrahlung loads; conduction time jitter; current asymmetry; current loss; downstream inductance; flared cathode system impedance time history; half-scale generator; high power radiation effects symmetry; impedance; multimodule system; output radiation; peak current; plasma opening switch; power-flow region; short-circuit shot; slotted cathode hardware; voltage degradation; Diodes; Electron beams; Jitter; Plasmas; Pulse shaping methods; Radiation effects; Shape; Switches; Testing; Voltage;
fLanguage
English
Journal_Title
Plasma Science, IEEE Transactions on
Publisher
ieee
ISSN
0093-3813
Type
jour
DOI
10.1109/27.602489
Filename
602489
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