• DocumentCode
    1325908
  • Title

    Reliability in Digital Systems with Asymmetrical Failure Modes

  • Author

    Meisel, William S. ; Schaeffer, Pembroke C.H.

  • Author_Institution
    Dept. of Elec. Engrg., University of Southern California, Los Angeles, Calif. 90007
  • Issue
    2
  • fYear
    1969
  • fDate
    5/1/1969 12:00:00 AM
  • Firstpage
    74
  • Lastpage
    75
  • Abstract
    Most present-day reliability schemes using redundancy to mask the failure of individual logic modules employ majority voting with the assumption that the replicated modules have symmetrical failure characteristics. An analysis is presented of such schemes when the modules exhibit asymmetrical failure modes; that is, the probability that a module fails with a 0 output is not equal to the probability that it fails with a 1 output. A general expression is presented which gives the reliability of a network consisting of n identical modules feeding a k-out-of-n voter. It is shown that a simple majority element does not always represent the optimal choice. Plots illustrating the results are included.
  • Keywords
    Circuit testing; Design engineering; Digital systems; Flip-flops; Interconnected systems; Logic; Reliability engineering; Reliability theory; Skin; Tin;
  • fLanguage
    English
  • Journal_Title
    Reliability, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9529
  • Type

    jour

  • DOI
    10.1109/TR.1969.5216980
  • Filename
    5216980