DocumentCode
1325908
Title
Reliability in Digital Systems with Asymmetrical Failure Modes
Author
Meisel, William S. ; Schaeffer, Pembroke C.H.
Author_Institution
Dept. of Elec. Engrg., University of Southern California, Los Angeles, Calif. 90007
Issue
2
fYear
1969
fDate
5/1/1969 12:00:00 AM
Firstpage
74
Lastpage
75
Abstract
Most present-day reliability schemes using redundancy to mask the failure of individual logic modules employ majority voting with the assumption that the replicated modules have symmetrical failure characteristics. An analysis is presented of such schemes when the modules exhibit asymmetrical failure modes; that is, the probability that a module fails with a 0 output is not equal to the probability that it fails with a 1 output. A general expression is presented which gives the reliability of a network consisting of n identical modules feeding a k-out-of-n voter. It is shown that a simple majority element does not always represent the optimal choice. Plots illustrating the results are included.
Keywords
Circuit testing; Design engineering; Digital systems; Flip-flops; Interconnected systems; Logic; Reliability engineering; Reliability theory; Skin; Tin;
fLanguage
English
Journal_Title
Reliability, IEEE Transactions on
Publisher
ieee
ISSN
0018-9529
Type
jour
DOI
10.1109/TR.1969.5216980
Filename
5216980
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