On generic diagnosability of circuits under the assumption of limited faults

The authors present a generic diagnosability result, under the assumption of limited faults, for circuits/systems having transfer function matrices whose s-coefficients are rational in the circuit/system parameters. A strictly lower n_f-dimensional subspace of the parameter space, called the fault space, contains the potentially faulty parameter values. Given the assumption of limited faults, i.e., at most n _f of N possible parameters have failed, generic diagnosability is shown with respect to the potentially faulty parameter space, which is an n_f-dimensional affine subset of the parameter space R^N