• DocumentCode
    1326225
  • Title

    Return-limited inductances: a practical approach to on-chip inductance extraction

  • Author

    Shepard, Kenneth L. ; Tian, Zhong

  • Author_Institution
    Dept. of Electr. Eng., Columbia Univ., New York, NY, USA
  • Volume
    19
  • Issue
    4
  • fYear
    2000
  • fDate
    4/1/2000 12:00:00 AM
  • Firstpage
    425
  • Lastpage
    436
  • Abstract
    Decreasing slew rates and efforts to reduce the resistance-capacitance (RC) delays of on-chip interconnect through design and technology have resulted in the growing importance of inductance in analyzing interconnect response for timing and noise analysis. In this paper, we consider a practical approach for extracting approximate inductances of on-chip interconnect. This approach, which we call the method of return-limited inductances, is based on performing the inductance modeling of signal lines and power-ground lines independently and on taking advantage of the power and ground distribution of the chip to localize inductive coupling. A set of simple geometry-based matrix decomposition rules guide sparsification in these extractions
  • Keywords
    inductance; integrated circuit interconnections; integrated circuit modelling; matrix decomposition; sparse matrices; integrated circuit interconnect; noise analysis; on-chip inductance; parameter extraction; power ground line; resistance-capacitance delay; return-limited inductance; signal line; slew rate; sparse matrix decomposition; timing analysis; Capacitance; Circuit noise; Copper; Coupling circuits; Delay; Inductance; Integrated circuit interconnections; Switching circuits; Timing; Wires;
  • fLanguage
    English
  • Journal_Title
    Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0278-0070
  • Type

    jour

  • DOI
    10.1109/43.838992
  • Filename
    838992