• DocumentCode
    1328925
  • Title

    Improved cryogenic sapphire oscillator with exceptionally high frequency stability

  • Author

    Chang, S. ; Mann, A.G. ; Luiten, A.N.

  • Author_Institution
    Dept. of Phys., Western Australia Univ., Nedlands, WA, Australia
  • Volume
    36
  • Issue
    5
  • fYear
    2000
  • fDate
    3/2/2000 12:00:00 AM
  • Firstpage
    480
  • Lastpage
    481
  • Abstract
    Extremely high short term frequency stability has been realised in oscillators based on liquid helium cooled sapphire resonators with a modified mounting structure. These oscillators have exhibited a fractional frequency stability (Allan deviation) of ~5.4×10-16τ½ for integration times (τ) of 1-4s and a minimum Allan frequency deviation of 2.4×10-16 at 32s. For integration times greater than 100s the oscillator frequency stability degrades approximately as 3×10-17τ½. This is the best stability reported to date for any frequency standard over integration times of 1-100s
  • Keywords
    Q-factor; circuit stability; cryogenic electronics; dielectric resonator oscillators; frequency stability; frequency standards; microwave oscillators; sapphire; 11.9 GHz; 6 K; 7.7 K; Al2O3; cryogenic sapphire oscillator; frequency standard; high frequency stability; integration time; liquid helium cooled resonators; modified mounting structure; oscillator frequency stability; short term frequency stability;
  • fLanguage
    English
  • Journal_Title
    Electronics Letters
  • Publisher
    iet
  • ISSN
    0013-5194
  • Type

    jour

  • DOI
    10.1049/el:20000338
  • Filename
    840114
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1328925