DocumentCode
1328937
Title
Magnetic Properties of Cu Nanoclusters Embedded in ZnO Thin Films
Author
Toh, C.C. ; Liu, X.D. ; Ho, Paul ; Chen, Jim S.
Author_Institution
Dept. of Mater. Sci. & Eng., Nat. Univ. of Singapore, Singapore, Singapore
Volume
47
Issue
10
fYear
2011
Firstpage
4003
Lastpage
4006
Abstract
Cu nonmagnetic metallic nanoclusters were embedded in the ZnO thin film by using nanocluster beam deposition. No presence of secondary phase was detected in X-ray diffraction (XRD) analysis, but secondary phases CuO and Cu2O nanoclusters were detected in films by transmission electron microscopy (TEM). Cu nanoclusters embedded in ZnO films have the average particle size around 8-10 nm. Cu atoms were surrounded by ZnO matrix, and the interface effect caused overlapping of p-orbital from O contributed by ZnO and d-orbital contributed by Cu as suggested by XPS and UV-Vis absorbance results. Alternating gradient field magnetometer (AGM) results show that the embedment of nonmagnetic Cu nanoclusters in ferromagnetic ZnO thin films can enhance the room temperature ferromagnetism of ZnO thin film up to maximum Ms = 2.64 emu/cc with small coercivities lower than 70 Oe. The saturation magnetization (Ms) value increases with Cu volume fraction in ZnO and decreases with Cu volume fraction after certain volume fractions of Cu were achieved. Based on the clues given by XPS results, +1 valence state of Cu is in the ferromagnetism favorable state, indicating possible spin polarization occurred and ferromagnetism induced in the system.
Keywords
II-VI semiconductors; X-ray diffraction; X-ray photoelectron spectra; coercive force; copper; ferromagnetic materials; magnetic thin films; nanomagnetics; nanostructured materials; particle size; semiconductor thin films; semimagnetic semiconductors; transmission electron microscopy; ultraviolet spectra; visible spectra; wide band gap semiconductors; zinc compounds; TEM; UV-Vis absorbance; X-ray diffraction; XPS; XRD; ZnO:Cu; alternating gradient field magnetometer; coercivities; ferromagnetic thin films; interface effect; magnetic properties; nanocluster beam deposition; nonmagnetic metallic nanoclusters; nonmagnetic nanoclusters; p-orbital overlapping; particle size; possible spin polarization; room temperature ferromagnetism; saturation magnetization; size 8 nm to 10 nm; temperature 293 K to 298 K; thin films; transmission electron microscopy; valence state; volume fraction; Copper; Lattices; Magnetization; Magnetomechanical effects; Saturation magnetization; Zinc oxide; Copper nanoclusters; magnetic films; magnetic semiconductors; zinc oxide;
fLanguage
English
Journal_Title
Magnetics, IEEE Transactions on
Publisher
ieee
ISSN
0018-9464
Type
jour
DOI
10.1109/TMAG.2011.2145364
Filename
6027569
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