• DocumentCode
    1330789
  • Title

    Electric Field Effects in Semiconductor Spin Transport—A Transfer Matrix Formalism

  • Author

    Roy, A.M. ; Nikonov, Dmitri E. ; Saraswat, Krishna C.

  • Author_Institution
    Dept. of Electr. Eng., Stanford Univ., Stanford, CA, USA
  • Volume
    47
  • Issue
    10
  • fYear
    2011
  • Firstpage
    2746
  • Lastpage
    2749
  • Abstract
    A transfer matrix method for simulating spin injection into semiconductors in the case of high electric fields has been developed. The nonlinear relationship between electron spin density and electrochemical potential splitting, the effect of electric field on spin diffusion lengths, and spin polarized drift current are accounted for. Using this approach, high magnetoresistance (MR) at high electric fields is predicted. This is due to spin accumulation reaching its extreme values for fermion statistics. This effect opens up a new direction for solving the problem of low MR that semiconductor spintronic devices are facing.
  • Keywords
    III-V semiconductors; electric field effects; elemental semiconductors; gallium arsenide; magnetoelectronics; magnetoresistance; silicon; spin dynamics; spin polarised transport; statistical analysis; GaAs; Si; electric field effects; electrochemical potential splitting; electron spin density; fermion statistics; high electric fields; high magnetoresistance; semiconductor spin transport; semiconductor spintronic devices; spin accumulation; spin diffusion lengths; spin injection; spin polarized drift current; transfer matrix method; Electric potential; Equations; Mathematical model; Metals; Semiconductor device modeling; Silicon; Spin polarized transport; Magnetoresistance (MR); semiconductor spintronics; spin transport;
  • fLanguage
    English
  • Journal_Title
    Magnetics, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9464
  • Type

    jour

  • DOI
    10.1109/TMAG.2011.2151843
  • Filename
    6027833