IDDQ testing of single floating gate defects using a two-pattern vector

Intermediate voltages may appear at the output of a gate in the presence of single floating gate defects. Propagation of the effect of the intermediate voltage to driven gate(s) allows detection of the defect by sensing the increase in I_DDQ consumption downstream in the circuit. The mechanisms responsible for the intermediate voltages are modelled, and, experimental measurements on circuits fabricated with the defect are found to be consistent with the proposed model and analysis