• DocumentCode
    1331463
  • Title

    The frequency behavior of the third-order intercept point in a waveguide photodiode

  • Author

    Jiang, H. ; Shin, D.S. ; Li, G.L. ; Vang, T.A. ; Scott, D.C. ; Yu, P.K.L.

  • Author_Institution
    Conextant Inc., Newport Beach, CA, USA
  • Volume
    12
  • Issue
    5
  • fYear
    2000
  • fDate
    5/1/2000 12:00:00 AM
  • Firstpage
    540
  • Lastpage
    542
  • Abstract
    In Hayes´s (1993) and Williams´s (1996) analyses, the photodiode nonlinearity is attributed to the space charge screening effect. In this paper, the third-order intermodulation distortions of a high frequency, large optical cavity p-i-n waveguide photodiode are characterized up to 18 GHz using a two-tone measurement. At high bias voltage, the third-order intercept point (IP3) of the waveguide photodiode is constant at low frequency and /spl sim/f/sup -3/ at high frequency. This closely agrees with our model, which is based upon variation of the photodiode impedance. The measured IP3 of the same device at low bias voltages indicates the contribution of space charge screening under low bias voltage or severe saturation.
  • Keywords
    intermodulation distortion; optical communication equipment; optical resonators; optical waveguides; p-i-n photodiodes; space charge; 18 GHz; frequency behavior; high bias voltage; high frequency large optical cavity p-i-n waveguide photodiode; low bias voltage; low bias voltages; measured IP3; photodiode impedance; photodiode nonlinearity; severe saturation; space charge screening; space charge screening effect; third-order intercept point; third-order intermodulation distortions; two-tone measurement; waveguide photodiode; Distortion measurement; Frequency measurement; Impedance; Intermodulation distortion; Low voltage; Optical distortion; Optical saturation; Optical waveguides; PIN photodiodes; Space charge;
  • fLanguage
    English
  • Journal_Title
    Photonics Technology Letters, IEEE
  • Publisher
    ieee
  • ISSN
    1041-1135
  • Type

    jour

  • DOI
    10.1109/68.841279
  • Filename
    841279