DocumentCode
1331799
Title
Effect of Spacer Layer Thickness on the Magnetic Properties of
Multilayers
Author
Saipriya, S. ; Kurian, Jobin ; Singh, Rajdeep
Author_Institution
Sch. of Phys., Univ. of Hyderabad, Hyderabad, India
Volume
47
Issue
10
fYear
2011
Firstpage
3111
Lastpage
3114
Abstract
Multilayers (ML) of SnO2 and Cu-Zn Ferrite were deposited by rf-sputtering. The effect of spacer layer (SnO2) thickness on the structural and magnetic properties of ML were studied. The disorder and strain in the system is found to increase with increasing spacer layer thickness. The interlayer coupling is found to decrease with increasing SnO2 layer thickness. The FMR intensity, magnetization and the exchange coupling strength initially increases then decreases with increasing SnO2 thickness. This behavior may be attributed to the oscillation in the exchange coupling across the non magnetic layer due to quantum interference of the electron waves reflected from the interfaces. The ML exhibit uniaxial anisotropy and the ML are found to be more homogeneous when the film normal is at an angle of 40° with the applied field. Decreasing magnetic moment and increasing resonance field at low temperatures indicated the presence of antiferromagnetic interactions in these ML.
Keywords
antiferromagnetic materials; copper compounds; exchange interactions (electron); ferrites; ferromagnetic resonance; magnetic anisotropy; magnetic moments; magnetic multilayers; quantum interference phenomena; sputter deposition; tin compounds; zinc compounds; FMR intensity; SnO2-Cu0.6Zn0.4Fe2O4; antiferromagnetic interaction; electron wave reflection; exchange coupling strength; ferromagnetic resonance; magnetic anisotropy; magnetic moment; magnetic multilayers; magnetic properties; magnetization; quantum interference; rf-sputter deposition; spacer layer thickness; structural properties; Couplings; Ferrites; Magnetic multilayers; Magnetic properties; Magnetic resonance; Magnetization; Temperature sensors; Interface phenomena; magnetic multilayers; magnetic resonance; sputtering;
fLanguage
English
Journal_Title
Magnetics, IEEE Transactions on
Publisher
ieee
ISSN
0018-9464
Type
jour
DOI
10.1109/TMAG.2011.2155627
Filename
6028129
Link To Document