• DocumentCode
    133322
  • Title

    High temperature thermoelectric properties of delafossite CuBO2

  • Author

    Ruttanapun, Chesta ; Jindajitawat, Phumin ; Buranasiri, Prathan ; Thowladda, Warawoot ; Neeyakorn, Worakarn ; Naenkieng, Daengdesh ; Harnwunggmoung, Adul ; Charoenphakdee, Anek ; Boonyopakorn, Narongchai ; Thanachayanont, Chanchana

  • Author_Institution
    Dept. of Phys., King Mongkut´s Inst. of Technol. Ladkrabang, Bangkok, Thailand
  • fYear
    2014
  • fDate
    5-8 March 2014
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    CuBO2 is prepared by a solid-state reaction method to investigate thermoelectric properties in high temperature. The XRD result confirms the CuBO2 compound existing in this method. The Seebeck reveals the compound displays p-type thermoelectric material. The experimental results of electrical resistivity exhibited results of 0.004 S/cm to 0.038 S/cm with the temperature range of 650 to 830 K. The Seebeck value is in the range of 450 μV/K to 950 μV/K, and the thermal conductivity is in the range of 1.4 × 10-5 to 5.3 × 10-5 W/m-K2 with the same temperature. The maximum PF and ZT is 5.3 × 10-5 W/m-K2 and 0.0016, respectively, at 960 K. This work demonstrates that the CuBO2 delafossite-oxide compound displays the p-type thermoelectric materials.
  • Keywords
    Seebeck effect; X-ray diffraction; copper compounds; electrical resistivity; thermal conductivity; CuBO2; Seebeck property; XRD; delafossite-oxide compound; electrical resistivity; high-temperature thermoelectric properties; p-type thermoelectric materials; solid-state reaction; temperature 650 K to 830 K; thermal conductivity; Compounds; Conductivity; Materials; Temperature distribution; Temperature measurement; Thermal conductivity; CuBO2; Delafossite; Solid state; Thermoelectric;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Information and Communication Technology, Electronic and Electrical Engineering (JICTEE), 2014 4th Joint International Conference on
  • Conference_Location
    Chiang Rai
  • Print_ISBN
    978-1-4799-3854-4
  • Type

    conf

  • DOI
    10.1109/JICTEE.2014.6804067
  • Filename
    6804067