Analysis of the nitrogen ion beam generated in a low-energy plasma focus device by a Faraday cup operating in the secondary electron emission mode

Author

Kelly, Héctor ; Lepone, Alejandro ; Márquez, Adriana ; Sadowski, Marek J. ; Baranowski, Jaroslaw ; Skladnik-Sadowska, Elzbieta

Author_Institution

Fac. de Ciencias Exactas y Naturales, Buenos Aires Univ., Argentina

Volume

26

Issue

1

fYear

1998

fDate

2/1/1998 12:00:00 AM

Firstpage

113

Lastpage

117

Abstract

The energy distribution and flux of fast nitrogen particles generated in a Mather-type plasma focus device operating at 0.4 Torr of N₂ pressure is reported. A Faraday cup operating in the secondary electron emission mode was employed. To determine the total number of beam particles, multiple scattering of the ions was taken into account. It has been possible to register the ion energy up to a lower kinetic energy threshold of ≈50 keV, which is a value much lower than that obtained with a Thomson spectrometer in a previous work

Keywords

ion beams; nitrogen; plasma diagnostics; plasma focus; plasma-beam interactions; secondary electron emission; 0.4 torr; 50 keV; Faraday cup; Mather-type plasma focus device; N₂; N₂ energy distribution; N₂ ion beam; N₂ particle flux; N₂ pressure; Thomson spectrometer; beam particle number; low-energy plasma focus device; multiple scattering; secondary electron emission mode; Electron emission; Impurities; Ion beams; Kinetic energy; Nitrogen; Particle beams; Particle scattering; Plasma devices; Plasma immersion ion implantation; Spectroscopy;

fLanguage

English

Journal_Title

Plasma Science, IEEE Transactions on

Publisher

ieee

ISSN

0093-3813

Type

jour

DOI

10.1109/27.659540

Filename

659540