• DocumentCode
    1334153
  • Title

    Accurate analytical delay expressions for ECL and CML circuits and their applications to optimizing high-speed bipolar circuits

  • Author

    Fang, Wen

  • Author_Institution
    Dept. of Electron. & Comput. Sci., Southampton Univ., UK
  • Volume
    25
  • Issue
    2
  • fYear
    1990
  • fDate
    4/1/1990 12:00:00 AM
  • Firstpage
    572
  • Lastpage
    583
  • Abstract
    A linearity study of the propagation delay of bipolar circuits carried out using a SPICE program is discussed. It is found that the behavior of the propagation delay is quite linear, and therefore analytical propagation delay expressions for ECL and CML circuits are derived using a sensitivity analysis. The validity of the expressions is checked by SPICE simulations and comparison to experimental data published in the literature, and agreement is within 5%. The expressions indicate that there is an optimum value of load resistance for logic circuits in order to achieve a minimum propagation delay. For present technology, logic circuits for silicon transistors can operate at the current density corresponding to maximum fT, and logic circuits for AlGaAs-GaAs heterojunction bipolar transistors (HBTs) should operate at a current density lower than that of maximum fT. Therefore, it is important to increase the collector current density of maximum fT for silicon bipolar circuits, or to decrease the base resistance RB and the forward transit time τF for HBT circuits, in order to increase the circuit speed
  • Keywords
    bipolar integrated circuits; circuit analysis computing; delays; emitter-coupled logic; heterojunction bipolar transistors; integrated logic circuits; sensitivity analysis; AlGaAs-GaAs; CML circuits; ECL; HBTs; SPICE program; SPICE simulations; Si; analytical delay expressions; collector current density; heterojunction bipolar transistors; high-speed bipolar circuits; linearity study; load resistance; logic circuits; optimum value; propagation delay; sensitivity analysis; Bipolar transistor circuits; Circuit simulation; Current density; Heterojunction bipolar transistors; Linearity; Logic circuits; Propagation delay; SPICE; Sensitivity analysis; Silicon;
  • fLanguage
    English
  • Journal_Title
    Solid-State Circuits, IEEE Journal of
  • Publisher
    ieee
  • ISSN
    0018-9200
  • Type

    jour

  • DOI
    10.1109/4.52186
  • Filename
    52186