• DocumentCode
    1335466
  • Title

    Tensor Distance Based Multilinear Locality-Preserved Maximum Information Embedding

  • Author

    Yang Liu ; Yan Liu ; Chan, K.C.C.

  • Author_Institution
    Dept. of Comput., Hong Kong Polytech. Univ., Kowloon, China
  • Volume
    21
  • Issue
    11
  • fYear
    2010
  • Firstpage
    1848
  • Lastpage
    1854
  • Abstract
    This brief paper presents a unified framework for tensor-based dimensionality reduction (DR) with a new tensor distance (TD) metric and a novel multilinear locality-preserved maximum information embedding (MLPMIE) algorithm. Different from traditional Euclidean distance, which is constrained by the orthogonality assumption, TD measures the distance between data points by considering the relationships among different coordinates. To preserve the natural tensor structure in low-dimensional space, MLPMIE directly works on the high-order form of input data and iteratively learns the transformation matrices. In order to preserve the local geometry and to maximize the global discrimination simultaneously, MLPMIE keeps both local and global structures in a manifold model. By integrating TD into tensor embedding, TD-MLPMIE performs tensor-based DR through the whole learning procedure, and achieves stable performance improvement on various standard datasets.
  • Keywords
    geometry; learning (artificial intelligence); matrix algebra; tensors; Euclidean distance; local geometry; manifold learning; multilinear locality-preserved maximum information embedding; tensor distance; tensor embedding; tensor-based dimensionality reduction; transformation matrices; Accuracy; Databases; Measurement; Symmetric matrices; Tensile stress; Dimensionality reduction; manifold learning; multilinear embedding; tensor distance; Artificial Intelligence; Linear Models; Mathematical Computing; Neural Networks (Computer); Pattern Recognition, Automated; Software Design;
  • fLanguage
    English
  • Journal_Title
    Neural Networks, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1045-9227
  • Type

    jour

  • DOI
    10.1109/TNN.2010.2066574
  • Filename
    5585773