• DocumentCode
    1335854
  • Title

    Methods of Reliability Demonstration Testing and Their Relationships

  • Author

    Guo, Huairui ; Liao, Haitao

  • Author_Institution
    ReliaSoft Corp., Tucson, AZ, USA
  • Volume
    61
  • Issue
    1
  • fYear
    2012
  • fDate
    3/1/2012 12:00:00 AM
  • Firstpage
    231
  • Lastpage
    237
  • Abstract
    Reliability Demonstration Testing (RDT) has been widely used in industry to verify whether a product has met a certain reliability requirement with a stated confidence level. To design RDTs, methods have been developed based on either the number of failures or the failure times. However, practitioners often have difficulty in determining which method to use for a specific design problem. In particular, the method based on the number of failures cannot be used when all the units are tested to failure, while the alternative based on failure times falls short in dealing with cases where no failures are expected. This paper elaborates on the two methods, and compares them from both practical and theoretical standpoints. The detailed discussions regarding the relationship between the two methods will help practitioners design RDTs, and understand when the two methods will lead to similar designs. A Weibull distribution is used in the relevant mathematical derivations, but the results can be extended to other widely used failure time distributions. Case studies are provided to demonstrate the use of the two methods in practice, and in developing equivalent RDT designs.
  • Keywords
    Weibull distribution; design engineering; reliability; testing; RDT designs; Weibull distribution; design problem; failure time distributions; mathematical derivations; reliability demonstration testing; reliability engineering; reliability requirement; Design methodology; Equations; Mathematical model; Maximum likelihood estimation; Reliability engineering; Upper bound; Binomial distribution; Weibull distribution; reliability demonstration test;
  • fLanguage
    English
  • Journal_Title
    Reliability, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9529
  • Type

    jour

  • DOI
    10.1109/TR.2011.2167782
  • Filename
    6030958