• DocumentCode
    1336500
  • Title

    Acceleration sensitivity of crystal resonators affected by the mass and location of electrodes

  • Author

    Lee, P.C.Y. ; Guo, X.

  • Author_Institution
    Dept. of Civil Eng. & Oper. Res., Princeton Univ., NJ, USA
  • Volume
    38
  • Issue
    4
  • fYear
    1991
  • fDate
    7/1/1991 12:00:00 AM
  • Firstpage
    358
  • Lastpage
    365
  • Abstract
    Predominant thickness-shear frequencies and modes of a crystal plate with electrodes of arbitrary shape and mass distribution are obtained by a finite-element method, based on Mindlin´s first-order equations with platings. These frequencies and modes are used in a perturbation method for computing the acceleration sensitivity of crystal resonators with electrodes. Computations are made for a square AT-cut quartz plate that is supported by a four-point mount and coated with identical square and uniform electrodes on the upper and lower faces of the plate. To study the effect of uneven distribution of electrode mass, acceleration sensitivities are calculated when a small mass is added at various locations near the edges of the square electrodes. It is found that the percent increase of the acceleration sensitivity of the resonator with a small added mass to that of the resonator without added mass ranges from 3.8% to 541.7%, depending on the location of the small mass placed at the edges of the electrodes.<>
  • Keywords
    crystal resonators; finite element analysis; frequency stability; quartz; Mindlin´s first-order equations; SiO/sub 2/; acceleration sensitivity; crystal resonators; electrode location effect; electrode mass effect; finite-element method; four-point mount; perturbation method; small added mass; square AT-cut quartz plate; thickness shear mode; uneven distribution of electrode mass; Acceleration; Contracts; Electrodes; Equations; Finite element methods; Frequency; Resonance; Shape; Stress; Two dimensional displays;
  • fLanguage
    English
  • Journal_Title
    Ultrasonics, Ferroelectrics, and Frequency Control, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0885-3010
  • Type

    jour

  • DOI
    10.1109/58.84275
  • Filename
    84275