• DocumentCode
    1337062
  • Title

    Ferrite Toroid Core Circuit Analysis

  • Author

    Betts, R. ; Bishop, G.

  • Author_Institution
    Federal Systems Div., IBM Corp., Owego, N. Y.
  • Issue
    1
  • fYear
    1961
  • fDate
    3/1/1961 12:00:00 AM
  • Firstpage
    51
  • Lastpage
    56
  • Abstract
    An analysis of the terminal characteristics of thin ferrite toroid cores under arbitrary drive and load conditions is presented. The analysis is founded only on the following two experimentally confirmed conditions: 1) the time required for a complete reversal of flux under unloaded conditions is inversely proportional to the magnitude of a step-driving field which is in excess of the critical field required to initiate flux change; 2) the open circuit voltage-time output waveforms caused by step driving currents are identical when normalized with respect to amplitude and time. The normalized output voltage waveform f¿(x) is used to develop a terminal characteristic equation. It is shown that f¿(x) may be obtained by using a nonideal step-input current. Utilizing a modified Gaussian equation to represent f¿(x), equations are developed to allow the prediction of core response to arbitrary input waveforms, using 4 parameters easily obtained from voltage response vs NI step-drive plots, and f(x), which is the integral of the normalized expression for the open circuit voltage f¿(x), and is proportional to the flux switched in the core. The equations are expanded to include a load circuit and to test the validity of the expressions developed. Theoretical and experimental results are compared for a core loaded with series RL and RLC circuits with both ramp and step-drive currents. Agreement is shown to be good, even though the core used was not particularly thin.
  • Keywords
    Circuit analysis; Circuit analysis computing; Circuit testing; Ferrites; Hysteresis; Integral equations; Logic circuits; RLC circuits; Switches; Voltage;
  • fLanguage
    English
  • Journal_Title
    Electronic Computers, IRE Transactions on
  • Publisher
    ieee
  • ISSN
    0367-9950
  • Type

    jour

  • DOI
    10.1109/TEC.1961.5219151
  • Filename
    5219151