• DocumentCode
    1338585
  • Title

    Equivalent Displacement Damage Dose for On-Orbit Space Applications

  • Author

    Inguimbert, Christophe ; Messenger, Scott

  • Author_Institution
    ONERA-DESP, Toulouse, France
  • Volume
    59
  • Issue
    6
  • fYear
    2012
  • Firstpage
    3117
  • Lastpage
    3125
  • Abstract
    The calculation of the displacement damage dose (DDD) in a material is not often as straightforward as simply combining the particle fluence and the nonionizing energy loss (NIEL) but often requires a consideration of the degradation parametrics of a particular microelectronic device. This paper defines an Equivalent Displacement Damage Dose (EDDD) which is more representative of the degradation of the device. Displacement damage radiation effects in solar cells will be used to illustrate the model.
  • Keywords
    dosimetry; energy loss of particles; radiation hardening (electronics); solar cells; degradation parametrics; displacement damage radiation effects; equivalent displacement damage dose; microelectronic device; nonionizing energy loss; particle ίuence; solar cells; Degradation; Ionization; Photovoltaic cells; Protons; Radiation effects; Silicon; Displacement damages; non-ionizing dose; nonionizing energy loss (NIEL); solar cells; space environment;
  • fLanguage
    English
  • Journal_Title
    Nuclear Science, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9499
  • Type

    jour

  • DOI
    10.1109/TNS.2012.2221477
  • Filename
    6359810
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1338585