• DocumentCode
    1339171
  • Title

    Arc-contact-insulating wall interactions in low voltage circuit-breakers

  • Author

    Rodriguez, P. ; Didier, J. ; Bernard, G. ; Rowe, S.

  • Author_Institution
    Centre de Recherches, Schneider Electr., Grenoble, France
  • Volume
    13
  • Issue
    2
  • fYear
    1998
  • fDate
    4/1/1998 12:00:00 AM
  • Firstpage
    480
  • Lastpage
    488
  • Abstract
    This experimental study deals with the interaction between an electrical arc, the contacts and the insulating side walls in low voltage circuit breakers. The influence of this on the breaking capacity, dielectric strength and device overheating after breaking are shown. In a confined volume, the arc-wall interaction defined the gaseous atmosphere in which the arc develops and depends on the nature of the insulating wall material. The gaseous atmosphere therefore fixes, in part, the arc behavior (arc voltage and arc movement) and the physical-chemical properties of the breaking medium surrounding the metallic surfaces (reducing or oxidizing). The arc-electrode interaction influences the capacity of the arc to transfer from the contacts to the arc quenching region and introduces surface pollution, through contact erosion (droplets, metallic vapors and other components). These combined effects can have a negative influence on general circuit breaker behavior
  • Keywords
    circuit breakers; circuit-breaking arcs; electric strength; electrodes; switchgear testing; arc movement; arc voltage; arc-contact-insulating wall interactions; arc-electrode interaction; breaking capacity; breaking medium; contact erosion; device overheating; dielectric strength; gaseous atmosphere; low voltage circuit-breakers; physical-chemical properties; surface pollution; Atmosphere; Circuit breakers; Contacts; Dielectric breakdown; Dielectric materials; Dielectrics and electrical insulation; Gas insulation; Low voltage; Pollution; Surface contamination;
  • fLanguage
    English
  • Journal_Title
    Power Delivery, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0885-8977
  • Type

    jour

  • DOI
    10.1109/61.660918
  • Filename
    660918