• DocumentCode
    1339196
  • Title

    ICMTS 1999 [Guest Editorial]

  • Author

    Jeppson, K.O. ; Mathewson, A.

  • Author_Institution
    Chalmers University of Technology
  • Volume
    13
  • Issue
    2
  • fYear
    2000
  • fDate
    5/1/2000 12:00:00 AM
  • Firstpage
    117
  • Lastpage
    118
  • Keywords
    Circuit testing; Integrated circuit manufacture; Microelectronics; Parameter extraction; Semiconductor device manufacture; Semiconductor device modeling; Semiconductor device testing; Solid state circuits; Thermal conductivity; Very large scale integration;
  • fLanguage
    English
  • Journal_Title
    Semiconductor Manufacturing, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0894-6507
  • Type

    jour

  • DOI
    10.1109/TSM.2000.843625
  • Filename
    843625
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1339196