• DocumentCode
    1339654
  • Title

    Measurement of S-Band Microwave Gas Breakdown by Enhancing the Electric Field in a Waveguide

  • Author

    Yang, Yi-Ming ; Yuan, Cheng-Wei ; Qian, Bao-Liang

  • Author_Institution
    Coll. of Optoelectron. Sci. & Eng., Nat. Univ. of Defense Technol. (NUDT), Changsha, China
  • Volume
    40
  • Issue
    12
  • fYear
    2012
  • Firstpage
    3427
  • Lastpage
    3432
  • Abstract
    With the development of narrow-band high-power-microwave (HPM) technology, air breakdown has become a serious problem that concerns to the HPM applications. A new method is presented in this paper to determine the electric field of the microwave air breakdown near the atmosphere pressures. Two metal pins were used to strengthen the microwave electric field in a sealed waveguide, putting on the symmetry axis. Some parameters such as gas pressure, temperature, and humidity could be changed conveniently to achieve gas breakdown. Experiment was carried out at the S-band (2.86-GHz) microwave of 180-ns duration and 5-MW peak power, and typical phenomena of plasmas introduced by microwave are analyzed. Furthermore, a new definition of breakdown threshold has been proposed based on breakdown probability, and the electric field threshold is also analyzed.
  • Keywords
    atmospheric pressure; electric breakdown; electric fields; microwave measurement; waveguides; HPM technology; S-Band microwave gas breakdown measurement; atmosphere pressures; breakdown probability; breakdown threshold; electric field enhancement; electric field threshold; frequency 2.86 GHz; gas pressure; humidity; metal pins; microwave air breakdown; microwave electric field; narrow-band high-power-microwave technology; plasma phenomena; power 5 MW; symmetry axis; time 180 ns; waveguide; Electric breakdown; Electromagnetic waveguides; Microwave oscillators; Microwave propagation; Microwave theory and techniques; Pins; Plasmas; Air breakdown; electric field enhancement; microwave; waveguide;
  • fLanguage
    English
  • Journal_Title
    Plasma Science, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0093-3813
  • Type

    jour

  • DOI
    10.1109/TPS.2012.2222450
  • Filename
    6361491