Nonlinear optical pulse propagation in a semiconductor medium in the transient regime. II. Interferometric sampling

Author

Finlayson, Neil ; Stegeman, George I.

Author_Institution

Opt. Sci. Center, Arizona Univ., Tucson, AZ, USA

Volume

26

Issue

4

fYear

1990

fDate

4/1/1990 12:00:00 AM

Firstpage

778

Lastpage

787

Abstract

For pt.I see ibid., vol.26, no.4, p.760-9 (1990). A numerical model of pulse propagation in a semiconductor is used to simulate the technique of interferometric sampling of the semiconductor response to an optical pulse. Interferometric sampling is a form of time-resolved interferometry which combines elements of classical interferometry and pump-probe techniques to obtain the transient response of nonlinear refractive index and absorption changes in a material. The technique is shown to accurately measure saturated changes in phase and transmittance, as well as the interband recombination time

Keywords

light absorption; light interferometry; nonlinear optics; refractive index; semiconductors; time resolved spectroscopy; interband recombination time; interferometric sampling; nonlinear optical pulse propagation; nonlinear refractive index; numerical model; phase; pump-probe techniques; semiconductor medium; time-resolved interferometry; transient regime; transient response; transmittance; Absorption; Numerical models; Optical interferometry; Optical materials; Optical propagation; Optical pulses; Phase change materials; Refractive index; Sampling methods; Transient response;

fLanguage

English

Journal_Title

Quantum Electronics, IEEE Journal of

Publisher

ieee

ISSN

0018-9197

Type

jour

DOI

10.1109/3.53396

Filename

53396