Photonic Chip-Based Simultaneous Multi-Impairment Monitoring for Phase-Modulated Optical Signals

Author

Vo, Trung D. ; Schröder, Jochen ; Pelusi, Mark D. ; Madden, Stephen J. ; Choi, Duk-Yong ; Bulla, Douglas A P ; Luther-Davies, Barry ; Eggleton, Benjamin J.

Author_Institution

Centre for Ultrahigh Bandwidth Devices for Opt. Syst., Univ. of Sydney, Sydney, NSW, Australia

Volume

28

Issue

21

fYear

2010

Firstpage

3176

Lastpage

3183

Abstract

We report the first experimental demonstration of simultaneous multi-impairment monitoring of phase-modulated 40 Gbit/s nonreturn to zero differential phase-shift keying (NRZ-DPSK) and 640 Gbit/s return-to-zero (RZ)-DPSK optical signals. Our approach exploits the femtosecond response time of the Kerr nonlinearity in a centimeter-scale, highly nonlinear, dispersion engineered chalcogenide planar waveguide to perform THz bandwidth RF spectrum analysis. The features observed on the radio-frequency (RF) spectrum are directly utilized to perform simultaneous group velocity dispersion and in-band optical signal-to-noise ratio (SNR) monitoring. We also numerically investigate the measurement accuracy of this monitoring technique, highlighting the advantages, and suitability of the chalcogenide rib waveguide.

Keywords

differential phase shift keying; microwave photonics; optical Kerr effect; optical communication equipment; optical dispersion; optical information processing; optical modulation; optical planar waveguides; spectral analysers; spectral analysis; Kerr nonlinearity; THz bandwidth RF spectrum analysis; femtosecond response time; group velocity dispersion monitoring; highly nonlinear dispersion engineered chalcogenide planar waveguide; in-band optical signal-to-noise ratio monitoring; multiimpairment monitoring; nonreturn-to-zero differential phase-shift keying; phase-modulated optical signals; photonic chip; return-to-zero differential phase-shift keying; Fiber nonlinear optics; Monitoring; Optical fibers; Optical noise; Radio frequency; Nonlinear optics; optical performance monitoring (OPM); optical planar waveguides; optical signal processing; spectrum analysis;

fLanguage

English

Journal_Title

Lightwave Technology, Journal of

Publisher

ieee

ISSN

0733-8724

Type

jour

DOI

10.1109/JLT.2010.2083635

Filename

5593860