• DocumentCode
    1341548
  • Title

    Reducing Common-Mode Noise in Two-Switch Forward Converter

  • Author

    Kong, Pengju ; Wang, Shuo ; Lee, Fred C. ; Wang, Zijian

  • Author_Institution
    Center for Power Electron. Syst., Virginia Polytech. Inst. & State Univ., Blacksburg, VA, USA
  • Volume
    26
  • Issue
    5
  • fYear
    2011
  • fDate
    5/1/2011 12:00:00 AM
  • Firstpage
    1522
  • Lastpage
    1533
  • Abstract
    This paper addresses the common-mode (CM) electromagnetic interference noise issues in the two-switch forward converter. The two-switch forward converter has low CM noise compared to other topologies because its symmetric primary-side circuit has two out-of-phase dv/dts that cancel each other. However, parasitic capacitances of the circuit significantly affect the symmetry and degrade the noise reduction. Moreover, the secondary-side circuit of the converter is not symmetric and still contributes to the CM noise. In this paper, the parasitic capacitances of the converter are first modeled. Different transformer structures and their parasitic capacitances are characterized. A general balance technique is introduced to further reduce the CM noise of the converter. For each transformer structure, balance can be achieved with proper connection of the windings terminals and control of the parasitic capacitances to minimize the CM noise of the converter. Experimental results validated the proposed techniques.
  • Keywords
    electromagnetic interference; power transformers; switching convertors; transformer windings; common mode noise; electromagnetic interference noise; noise reduction; parasitic capacitances; secondary side circuit; symmetric primary side circuit; transformer structure; two switch forward converter; windings terminals; Capacitance; Converters; Noise; Power transformers; Switches; Topology; Windings; Common-mode (CM) noise; transformer structure; two-switch forward;
  • fLanguage
    English
  • Journal_Title
    Power Electronics, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0885-8993
  • Type

    jour

  • DOI
    10.1109/TPEL.2010.2082566
  • Filename
    5593890