DocumentCode
1341560
Title
Zero-Crossing-Based Ultra-Low-Power A/D Converters
Author
Lee, Hae-Seung ; Brooks, Lane ; Sodini, Charles G.
Author_Institution
Massachusetts Inst. of Technol., Cambridge, MA, USA
Volume
98
Issue
2
fYear
2010
Firstpage
315
Lastpage
332
Abstract
Since the first demonstration of a comparator-based switched-capacitor circuit, analog-to-digital (A/D) converters based on virtual ground detection have made steady and significant progress. Comparators have been replaced by zero-crossing detectors, leading to the development of zero-crossing based circuits for faster speed and lower power. All facets of performance including the sampling rate, effective number of bits, noise floor, and figure-of-merit have improved substantially. This paper focuses on recent implementations of zero-crossing based A/D converters and discusses the technical issues unique to these A/D converters as well as solutions that have been developed to improve their performance and practicality. A series of prototype designs whose performance ranges from 8 bit, 200 MS/s to 12 bit, 50 MS/s are described. The ultimate low power potentials of these A/D converters are compared with various different types of complementary metal-oxide-semiconductor A/D converters from a fundamental thermal noise standpoint.
Keywords
analogue-digital conversion; comparators (circuits); detector circuits; low-power electronics; analog-to-digital converters; comparator-based switched-capacitor circuit; complementary metal-oxide-semiconductor A/D converters; thermal noise; ultra-low-power A/D converters; virtual ground detection; zero-crossing detectors; Analog-digital conversion; Circuit noise; Detectors; Face detection; Noise figure; Noise measurement; Prototypes; Sampling methods; Switched capacitor circuits; Switching converters; A/D converter; data conversion; mixed signal;
fLanguage
English
Journal_Title
Proceedings of the IEEE
Publisher
ieee
ISSN
0018-9219
Type
jour
DOI
10.1109/JPROC.2009.2032570
Filename
5340676
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