• DocumentCode
    1341591
  • Title

    Cumulative Damage Processes and Alertness of the Worker

  • Author

    Ramanarayanan, R.

  • Author_Institution
    Dept. of Mathematics//Annamalai University//Annamalainagar 608 101 INDIA
  • Issue
    4
  • fYear
    1976
  • Firstpage
    281
  • Lastpage
    283
  • Abstract
    A device which is exposed to the cumulative damage process due to the occurrence of shocks is considered. The life distribution of the device is obtained here. Damages occur to the device when the worker is not alert or the device is weak. Known results in counter theory are used to obtain results.
  • Keywords
    Art; Convolution; Counting circuits; Electric shock; Exponential distribution; Mathematical model; Reliability theory; Solid modeling; Alertness; Cumulative damage; Stable distribution; Threshold;
  • fLanguage
    English
  • Journal_Title
    Reliability, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9529
  • Type

    jour

  • DOI
    10.1109/TR.1976.5219997
  • Filename
    5219997
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1341591