• DocumentCode
    1342347
  • Title

    Model checking on timed-event structures

  • Author

    Dasgupta, Pallab ; Deka, Jatindra Kumar ; Chakrabarti, P.P.

  • Author_Institution
    Indian Inst. of Technol., Kharagpur, India
  • Volume
    19
  • Issue
    5
  • fYear
    2000
  • fDate
    5/1/2000 12:00:00 AM
  • Firstpage
    601
  • Lastpage
    611
  • Abstract
    We propose a new style of model checking of timed transition systems, where instead of reasoning about the timing of states with specific properties, we reason about the timings of events with specific properties. This shift in paradigm appears to be useful for verification of edge triggered control paths, where we are more interested in the timings of changes in signal values. We propose a temporal logic, event-triggered timed computation tree logic (ETCTL), which allows the specification of event properties such as posedge(signal) and negedge(signal) along with real time computation tree logic (RTCTL) properties. We show that all ETCTL properties are interval independent, that is, their truth can never change on states between successive events. By virtue of the interval independent property, reasoning about timings of events (using ETCTL) is more efficient computationally than reasoning about general timed properties. We present a labeling algorithm, and suggest extensions to automata theoretic and symbolic approaches
  • Keywords
    computational complexity; formal verification; logic CAD; temporal logic; timing; edge triggered control paths; event-triggered timed computation tree logic; interval independent property; labeling algorithm; model checking; real time computation tree logic properties; temporal logic; timed transition systems; timed-event structures; timing verification; Automata; Circuits; Clocks; Delay effects; Explosives; Formal verification; Hardware design languages; Labeling; Logic; Timing;
  • fLanguage
    English
  • Journal_Title
    Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0278-0070
  • Type

    jour

  • DOI
    10.1109/43.845084
  • Filename
    845084