DocumentCode
1342977
Title
Evaluation of probe impedance due to thin-skin eddy-current interaction with surface cracks
Author
Bowler, J.R. ; Harfield, N.
Author_Institution
Dept. of Phys., Surrey Univ., Guildford, UK
Volume
34
Issue
2
fYear
1998
fDate
3/1/1998 12:00:00 AM
Firstpage
515
Lastpage
523
Abstract
Crack detection using eddy-current nondestructive testing is often carried out at frequencies such that the skin depth of the induced current is much smaller than the crack dimensions. The induced current then flows in a thin skin at the conductor surface and at the faces of a surface crack. In the case of a crack that acts as an impenetrable barrier to electric current, the electromagnetic field at the crack surface can be represented, at an arbitrary frequency, in terms of a potential which satisfies a two-dimensional Laplace equation. The boundary conditions required in the solution of the Laplace equation have not yet been determined for the general case, but we have derived approximate boundary conditions which are applicable in the thin-skin regime. The conditions derived are valid for cracks in materials of arbitrary permeability. From the harmonic solutions of the Laplace equation, the impedance change of the excitation coil due to the defect has been calculated for cracks in aluminum and ferromagnetic steel. Comparisons between predictions and experimental measurements on rectangular slots show good agreement, thus corroborating the theory and the numerical calculations
Keywords
Laplace equations; crack detection; eddy current testing; skin effect; Al; aluminum; boundary condition; conductor; defect; eddy current nondestructive testing; electromagnetic field; excitation coil; ferromagnetic steel; permeability; probe impedance; rectangular slot; skin effect; surface crack detection; two-dimensional Laplace equation; Boundary conditions; Conductors; Face detection; Frequency; Laplace equations; Nondestructive testing; Probes; Skin; Surface cracks; Surface impedance;
fLanguage
English
Journal_Title
Magnetics, IEEE Transactions on
Publisher
ieee
ISSN
0018-9464
Type
jour
DOI
10.1109/20.661483
Filename
661483
Link To Document