• DocumentCode
    1343176
  • Title

    Bayesian segmentation via asymptotic partition functions

  • Author

    Lanterman, Aaron D. ; Grenander, Ulf ; Miller, Michael I.

  • Author_Institution
    Coordinated Sci. Lab., Illinois Univ., Urbana, IL, USA
  • Volume
    22
  • Issue
    4
  • fYear
    2000
  • fDate
    4/1/2000 12:00:00 AM
  • Firstpage
    337
  • Lastpage
    347
  • Abstract
    Asymptotic approximations to the partition function of Gaussian random fields are derived. Textures are characterized via Gaussian random fields induced by stochastic difference equations determined by finitely supported, stationary, linear difference operators, adjusted to be nonstationary at the boundaries. It is shown that as the scale of the underlying shape increases, the log-normalizer converges to the integral of the log-spectrum of the operator inducing the random field. Fitting the covariance of the fields amounts to fitting the parameters of the spectrum of the differential operator-induced random field model. Matrix analysis techniques are proposed for handling textures with variable orientation. Examples of texture parameters estimated from training data via asymptotic maximum-likelihood are shown. Isotropic models involving powers of the Laplacian and directional models involving partial derivative mixtures are explored. Parameters are estimated for mitochondria and actin-myocin complexes in electron micrographs and clutter in forward-looking infrared images. Deformable template models are used to infer the shape of mitochondria in electron micrographs, with the asymptotic approximation allowing easy recomputation of the partition function as inference proceeds
  • Keywords
    Bayes methods; Gaussian processes; difference equations; image segmentation; image texture; matrix algebra; maximum likelihood estimation; Bayesian segmentation; Gaussian random fields; IR images; actin-myocin complexes; asymptotic maximum-likelihood; asymptotic partition functions; clutter; deformable template models; differential operator-induced random field model; electron micrographs; field covariance fitting; finitely-supported stationary linear difference operators; forward-looking infrared images; isotropic models; log-normalizer convergence; log-spectrum; matrix analysis techniques; mitochondria; parameter estimation; spectrum parameter fitting; stochastic difference equations; texture parameters; Bayesian methods; Covariance matrix; Difference equations; Electrons; Laplace equations; Maximum likelihood estimation; Parameter estimation; Shape; Stochastic processes; Training data;
  • fLanguage
    English
  • Journal_Title
    Pattern Analysis and Machine Intelligence, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0162-8828
  • Type

    jour

  • DOI
    10.1109/34.845376
  • Filename
    845376