• DocumentCode
    1343812
  • Title

    A Reliability Growth Model

  • Author

    Sriwastav, G.L.

  • Author_Institution
    Department of Statistics; Dibrugarh University; Dibrugarh - 786004 INDIA.
  • Issue
    5
  • fYear
    1978
  • Firstpage
    306
  • Lastpage
    307
  • Abstract
    A system can be in one of two states: perfect (s0) or imperfect (s1). At any trial, the system can succeed or fail if it is in s1, but will never fail if in s0. After every failure, some corrective action is taken which, with a chance ¿, will lead to a transition to s0. Even if the corrective action does not succeed, i.e. the system is still in s1, the probability of failure reduces by a constant multiple at the next trial. Expressions for the probability that the system will be in s1 at trial n and the unconditional probability that the system fails in trial n, are derived. The latter can be expressed in terms of the former. These probabilities depend not only on the number of successes in n trials but on their sequence.
  • Keywords
    Probability; Reliability theory; System testing; Corrective action; Reliability growth; System state;
  • fLanguage
    English
  • Journal_Title
    Reliability, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9529
  • Type

    jour

  • DOI
    10.1109/TR.1978.5220393
  • Filename
    5220393