DocumentCode
1343812
Title
A Reliability Growth Model
Author
Sriwastav, G.L.
Author_Institution
Department of Statistics; Dibrugarh University; Dibrugarh - 786004 INDIA.
Issue
5
fYear
1978
Firstpage
306
Lastpage
307
Abstract
A system can be in one of two states: perfect (s0) or imperfect (s1). At any trial, the system can succeed or fail if it is in s1, but will never fail if in s0. After every failure, some corrective action is taken which, with a chance ¿, will lead to a transition to s0. Even if the corrective action does not succeed, i.e. the system is still in s1, the probability of failure reduces by a constant multiple at the next trial. Expressions for the probability that the system will be in s1 at trial n and the unconditional probability that the system fails in trial n, are derived. The latter can be expressed in terms of the former. These probabilities depend not only on the number of successes in n trials but on their sequence.
Keywords
Probability; Reliability theory; System testing; Corrective action; Reliability growth; System state;
fLanguage
English
Journal_Title
Reliability, IEEE Transactions on
Publisher
ieee
ISSN
0018-9529
Type
jour
DOI
10.1109/TR.1978.5220393
Filename
5220393
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