• DocumentCode
    1343870
  • Title

    A compact high-speed Miller-capacitance-based sample-and-hold circuit

  • Author

    Chen, Ming-Jer ; Gu, Yen-Bin ; Huang, Jen-Yin ; Shen, Wei-Chen ; Wu, Terry ; Hsu, Po-Chin

  • Author_Institution
    Dept. of Electron. Eng., Nat. Chiao Tung Univ., Hsinchu, Taiwan
  • Volume
    45
  • Issue
    2
  • fYear
    1998
  • fDate
    2/1/1998 12:00:00 AM
  • Firstpage
    198
  • Lastpage
    201
  • Abstract
    The existing Miller-capacitance-based sample-and-hold circuit has been simplified into a compact one, achieved by replacing the operational amplifier in the Miller feedback circuit with a simple CMOS inverter. As a result, the area consumption is greatly reduced while maintaining the original advantages of high switching speed and high sampling precision. The on-chip test circuitry for the proposed compact sample-and-hold has been fabricated and characterized. Experimental results have shown that for a short clock transition time down to equipment limit of 1.8 ns, the sampling error becomes independent of the input over a small input voltage range of 1 V. This range can be substantially expanded by lowering the clock transition time, moreover, another compact Miller-capacitance-based sample-and-hold circuit with a dummy transistor included has been implemented on-chip and has experimentally exhibited a sampling error voltage of less than 6 mV over an input voltage range of 2.5 V. The spectrum behaviors of the compact circuits with and without a dummy transistor have been measured, showing an improvement on the quality of the circuit by increasing the clock frequency
  • Keywords
    CMOS analogue integrated circuits; analogue processing circuits; capacitance; circuit feedback; sample and hold circuits; 1.8 ns; 2.5 V; CMOS inverter; Miller feedback circuit; Miller-capacitance-based circuit; area consumption reduction; clock transition time; compact high-speed S/H circuit; dummy transistor; onchip test circuitry; sample/hold circuit; sampling error; Capacitance; Circuit testing; Clocks; Feedback circuits; Inverters; Operational amplifiers; Sampling methods; Switches; Switching circuits; Voltage;
  • fLanguage
    English
  • Journal_Title
    Circuits and Systems I: Fundamental Theory and Applications, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1057-7122
  • Type

    jour

  • DOI
    10.1109/81.661692
  • Filename
    661692