DocumentCode
1344499
Title
Determining the effective number of bits of high resolution digitizers
Author
Simöes, J. Basilio ; Loureiro, Custódio F M ; Landeck, Jorge ; Correia, Carlos M B A
Author_Institution
Dept. de Fisica, Coimbra Univ., Portugal
Volume
44
Issue
3
fYear
1997
fDate
6/1/1997 12:00:00 AM
Firstpage
407
Lastpage
410
Abstract
A new testing method has been used to evaluate the dynamic performance of several digitizing systems used in nuclear physics experiments. This method is useful for characterizing high resolution analog to digital converters when a pure enough signal source is not available. The signal to noise ratio of the digitizer, excluding the harmonic components from the noise, is the computed parameter. The use of this method to estimate jitter errors is also studied
Keywords
analogue-digital conversion; detector circuits; electron device noise; nuclear electronics; bits; high resolution ADC; high resolution digitizers; jitter errors; signal to noise ratio; Analog-digital conversion; Dynamic range; Harmonic distortion; Jitter; Linearity; Manufacturing; Nuclear physics; Signal resolution; Signal to noise ratio; System testing;
fLanguage
English
Journal_Title
Nuclear Science, IEEE Transactions on
Publisher
ieee
ISSN
0018-9499
Type
jour
DOI
10.1109/23.603681
Filename
603681
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