• DocumentCode
    1345085
  • Title

    A Reliability Model for Error Correcting Memory Systems

  • Author

    Ayache, J.M. ; Diaz, M.

  • Author_Institution
    Laboratoire d´´Automatique et d´´Analyse des Systÿmes du CNRS; 7 Avenue du Colonel Roche; 31400 Toulouse, FRANCE.
  • Issue
    4
  • fYear
    1979
  • Firstpage
    310
  • Lastpage
    315
  • Abstract
    This paper evaluates the reliability of a memory system incorporating any sort of linear error-correcting code. If the failure hypothesis is too simple (viz, a failure affects the entire memory chip or only one memory bit) an evaluation of reliability can be wrong. The following considerations are thus important: 1. The failure model is based on the internal design of the memory chip. 2. The memory system hardware is accurately accounted for. The resulting model is very close to the hardware implementation and depends on six parameters. The model is very useful for easily comparing memory systems and for deriving tradeoffs among the implementation possibilities for the design of memory systems.
  • Keywords
    Decoding; Error correction; Error correction codes; Fault tolerant systems; Hardware; Integrated circuit interconnections; Integrated circuit modeling; Metallization; Printed circuits; Registers; Error-correcting codes; Fault tolerant memories; Reliability modeling;
  • fLanguage
    English
  • Journal_Title
    Reliability, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9529
  • Type

    jour

  • DOI
    10.1109/TR.1979.5220616
  • Filename
    5220616