• DocumentCode
    1345603
  • Title

    Log-Rank vs X Test for Exponentiality

  • Author

    Walker, Crayton C. ; McLeavey, Dennis W. ; Rogers, Warren

  • Author_Institution
    Dept. of Management and Administrative Sciences; University of Connecticut; Storrs, CT 06268 USA.
  • Issue
    1
  • fYear
    1980
  • fDate
    4/1/1980 12:00:00 AM
  • Firstpage
    45
  • Lastpage
    48
  • Abstract
    This paper appraises a convenient test sometimes recommended to determine whether a set of observations has been drawn from an exponential distribution with unknown mean. The test uses simple linear regression techniques. Historically, it has been used in an intuitive manner. The intuitive procedure usually involves plotting logarithms of the empirical Cdf against corresponding observed values, then `eyeballing´ the plotted points for linearity, or intuitively determining whether r2 calculated for the bivariate distribution is `high enough´ or not. Using the objective procedure introduced in this paper, one regresses logarithms of ranks against observed values, calculates a standardized slope statistic, and checks this value against the tabled rejection region(s) provided. Our appraisal of the s-power of the objective log-rank test suggests that it is less s-powerful than competing tests (W, S*, D*) at larger sample sizes. Its relative performance appears to improve somewhat for smaller sample sizes. It seems fair to describe the objective log-rank test as a medium-grade test. Therefore, the practitioner should use the competing tests, unless samples are small, or practical considerations, such as convenience, are decisive in some particular situation. If convenience is important, then the log-rank test with the standardized slope used as the test statistic is an attractive option. The use of the log-rank test in its intuitive form is not recommended at all, since it very likely inclines the practitioner too often to accept the exponential hypothesis when false.
  • Keywords
    Appraisal; Error analysis; Exponential distribution; Linearity; Reliability engineering; Reliability theory; Statistical analysis; Statistical distributions; Statistics; Testing; Exponential distribution; Goodness of fit; Reliability theory; Slope of regression line; Test of distributional hypothesis; r2; s-Power;
  • fLanguage
    English
  • Journal_Title
    Reliability, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9529
  • Type

    jour

  • DOI
    10.1109/TR.1980.5220707
  • Filename
    5220707