DocumentCode
1345963
Title
3-State and 5-State Reliability Models
Author
Ansell, J. ; Bendell, A. ; Humble, S. ; Mudhar, C.S.
Author_Institution
Department of Mathematics and Statistics; Keele University; Keele ENGLAND.
Issue
2
fYear
1980
fDate
6/1/1980 12:00:00 AM
Firstpage
176
Lastpage
177
Abstract
This note considers models for devices subject to 1) partial and catastrophic failure, repair and replacement 2) each of two types of partial and catastrophic failures.
Keywords
Biographies; Cities and towns; Degradation; Educational institutions; Markov processes; Mathematical model; Mathematics; Reliability theory; Statistics; Steady-state; 3-state device; 5-state device; Failure to idle; Failure to operate; Partial failure; Repair;
fLanguage
English
Journal_Title
Reliability, IEEE Transactions on
Publisher
ieee
ISSN
0018-9529
Type
jour
DOI
10.1109/TR.1980.5220772
Filename
5220772
Link To Document