DocumentCode
1346439
Title
Planning Simple Step-Stress Accelerated Life Tests Using Bayesian Methods
Author
Yuan, Tao ; Liu, Xi ; Kuo, Way
Author_Institution
Dept. of Ind. & Syst. Eng., Ohio Univ., Athens, OH, USA
Volume
61
Issue
1
fYear
2012
fDate
3/1/2012 12:00:00 AM
Firstpage
254
Lastpage
263
Abstract
This study proposes Bayesian methods for planning optimal simple step-stress accelerated life tests. The Bayesian approach is an attractive alternative to the maximum likelihood method when there is uncertainty in the planning values of the model parameters. The uncertainty in the planning values is described by a joint prior distribution of the model parameters. The optimization criterion is defined as minimization of the pre-posterior variance of the logarithm of a quantile life at the normal stress condition. Two optimization algorithms, one based on Monte Carlo integration, and the other based on large-sample approximation, are developed to find the optimal plans. Nonparametric kernel smoothing technique is adopted in both algorithms to reduce the computational time. The proposed Bayesian approach is also extended to the design of three-level step-stress accelerated life tests. Effects of prior and sample size on the optimal plans are also investigated. Results indicate that both the prior, and the sample size affect the optimal Bayesian plans. And under certain conditions, the Bayesian approach, and the maximum likelihood approach provide very similar optimal plans.
Keywords
Bayes methods; Monte Carlo methods; approximation theory; life testing; maximum likelihood estimation; minimisation; Bayesian method; Monte Carlo integration; large-sample approximation; maximum likelihood method; minimization; nonparametric kernel smoothing technique; optimization algorithm; planning value; stress accelerated life test; Approximation methods; Bayesian methods; Joints; Life estimation; Optimization; Planning; Stress; Accelerated life tests; Bayesian approach; Weibull distribution; cumulative exposure model;
fLanguage
English
Journal_Title
Reliability, IEEE Transactions on
Publisher
ieee
ISSN
0018-9529
Type
jour
DOI
10.1109/TR.2011.2170104
Filename
6041049
Link To Document