DocumentCode
1346478
Title
Scientific Interchange
Author
Weir, W.Thomas
Author_Institution
Evaluation Associates, Inc.; GSB Bldg., 1 Belmont Avenue; Bala Cynwyd, PA 19004 USA.
Issue
4
fYear
1980
Firstpage
346
Lastpage
349
Abstract
This paper reports on the 1979 IEEE delegation´s visit to the People´s Republic of China, 1979 September 15 to October 7. Particular attention is given to the China Electronic Product Reliability and Environmental Testing Research Institute; the Institute is the only one of its kind in the People´s Republic of China and has the responsibility to develop reliability work on electronic products and to act as a `forcing function´ to improve the reliability of China´s electronic products.
Keywords
Electronic equipment testing; Ferrimagnetic materials; Magnetic materials; Maintenance; Microwave devices; Photovoltaic cells; Reliability engineering; Semiconductor device reliability; Software engineering; X-ray lasers; Delegation; People´s Republic of China; Visit;
fLanguage
English
Journal_Title
Reliability, IEEE Transactions on
Publisher
ieee
ISSN
0018-9529
Type
jour
DOI
10.1109/TR.1980.5220869
Filename
5220869
Link To Document