• DocumentCode
    1346483
  • Title

    Dendritic material as a dry-release sacrificial layer

  • Author

    Suh, Hyuk-Jeen ; Bharathi, Pamidighantam ; Beebe, David J. ; Moore, Jeffrey S.

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Illinois Univ., Urbana, IL, USA
  • Volume
    9
  • Issue
    2
  • fYear
    2000
  • fDate
    6/1/2000 12:00:00 AM
  • Firstpage
    198
  • Lastpage
    205
  • Abstract
    A dry-release process using highly structured dendritic material, specifically, hyperbranched polymers (HBP´s), has been developed. A particular HBP under study, known as HB560, has been characterized and successfully integrated with microelectromechanical systems processing. An array of electroplated nickel cantilever beams 100 /spl mu/m/spl times/100 /spl mu/m /spl sim/1000 /spl mu/m in length has been successfully fabricated and dry released. The required release time is 10 min at 600/spl deg/C in O/sub 2/. Single open-ended microchannels were fabricated to determine the etch time and tunneling length achieved using HB560 as a sacrificial material. The time improvement for the sacrificial release is on the order of 40/spl times/ compared to standard HF wet-etch processes. Etch lengths of 1 cm have been successfully demonstrated with a sacrificial layer aspect ratio of 1600. A photosensitive version of the dendritic material has also been synthesized and characterized to reduce the process steps.
  • Keywords
    dendritic structure; micromechanical devices; polymer films; sputter etching; tunnelling; 600 C; HB560; Ni; aspect ratio; dendritic material; dry etching; dry release process; electroplated nickel cantilever beam array; hyperbranched polymer; microchannel fabrication; microelectromechanical system; sacrificial layer; tunneling; Adhesives; Chemical technology; Dry etching; Hafnium; Microelectromechanical systems; Microstructure; Nickel; Polymers; Structural beams; Wet etching;
  • fLanguage
    English
  • Journal_Title
    Microelectromechanical Systems, Journal of
  • Publisher
    ieee
  • ISSN
    1057-7157
  • Type

    jour

  • DOI
    10.1109/84.846700
  • Filename
    846700